Initially, AFMs (atomic force microscopes) were mainly used to obtain images of samples at the nanoscale. Then, by improving equipment and the development of control modules, their possibilities have been expanded beyond the imaging applications. Currently it is possible to use the AFM as a complete modern tridimensioanl profilometer, able to measure very accurately the various parameters related to the forces that develop between the sample and the tip. This has also greatly expanded the boundaries of the possible applications.
The EasyScan 2 AFM in the laboratories of Eontych is equipped with several modules: in addition to the basic one, there are also the Dynamic Module and the Mode Extension Module. Beyond the normal imaging mode, are therefore also possible measures of Dynamic Force (intermittent contact, etc..) and those of Phase Contrast, Force Modulation, Spreading Resistance.
Also through the use of the SPIP software, it is possible to perform sophisticated processing and full reports of the required parameters, such as measures of roughness.
Eontych therefore can offer a wide range of precision measurements on samples of various types, such as metals, plastics, glass, new materials, etc..
It is possible to require both direct services of measurements and research collaborations. The shareholders and administrators of the company have long experience in the preparation and execution of projects at local, national and European levels, and so they can provide expert technical advice.
Nanogranulometry
Many processes involve the presence of particles suspended in a fluid (eg air or water), and it is important to accurately measure their characteristics. Generally, powders are characterized by a statistical distribution of shapes and sizes.
With ultrafine particles (smaller than 0.1 μm) and nanopowder (size below 0.05 μm) usually scientists use iopto-electronic techniques based on different types of measurement of the light scattered by particles undergoing Brownian motion (the random motion due to thermal motion of particles suspended in fluid). The two most interesting techniques are DLS (Dynamic Light Scattering), also called PCS (Photon Correlation Spectroscopy) and NTA (Nanoparticle Tracking and Analysis), which also allows to observe how the particles are organized into groups or clusters.
Eontych is developing partnerships and proposing project involving the use of these techniques to problems of great social importance and difficult to solve, such as testing of nanopowders in industrial and civil environments.
Building nanostructures
Structures at the nanoscale can be obtained with physical methods by reducing the size of larger structures ( "top down" approach).
The "bottom up" approach is the other possible way followed to operate at the nanometer level. In this case, starting for example from single molecules, scientists try to direct the assembling process to create complex nanostructures. Eontych is developing international contacts within the bottom-up techniques, believing that in the near future they can produce significant results and applications, with a strong impact on many issues of great importance for the global economy.
