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The shareholders and administrators of Eontych are fully aware that, working in high technology sectors, it is crucial to target investments to equip itself with sophisticated instrumentation, so that the work of highly skilled personnel can be adequately supported.
For this reason one of the first operations was the purchase of an atomic force microscope (AFM - Atomic Force Microscope), which provides the basis to operate on the nanoscale. The choice fell on a very compact and modular device, the EasyScan 2 by Nanosurf, a Swiss company experiencing rapid growth. The device allows measurements in contact, no contact (Dynamic Mode), phase contrast, magnetic force, resistivity (spreading resistance). To improve performance Eontych also employs an active anti-vibration platform.
Obviously, given the complexity of the measurements on the nanoscale, it is essential use adequate processing software. Eontych chose one of the industry standards, the SPIP modular program by Image Metrology. This is a highly specialized software for image analysis on micro and nano scale, which allows to perform a wide range of operations on the captured images, including: 2D and 3D animations, automatic calibration, Fourier analysis, particle identification .
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